AA072

Reticle 35mm Calibration Rule .001In/.025mm

This English and Metric micrometer reticle is used for critical measurements of object features. The English scale measures 0 to 0.90” in 0.001” increments. The Metric scale measures 0 to 23mm in 0.025mm increments. The pattern line width is 0.0002” ±0.00004” (0.005mm ± 0.001mm). The pattern has an overall accuracy of 0.00004” (0.001mm).

The Reticle Pattern is very durable, double layer, deposited evaporative Chrome/Chrome Oxide, for a reflectivity of less than 5% looking at the pattern. The Patterns on all Reticles manufactured by Max Levy are replicated from Precision Chrome on Glass Tooling under clean room conditions. 

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35mm Compatibility Chart 

Full Compatibility Chart