This reticle contains a major grid with a precision minor grid in one of the squares. It can be used to provide X, Y location to 0.07mm. The pattern contains a 7mm square divided into 100 0.7mm X 0.7mm squares. One square contains a minor grid with a 10 X 10 array of 0.07mm squares. The pattern line width is 0.025mm ±0.0025mm. The pattern has an overall accuracy of 0.001mm.
The Pattern is right reading looking through the glass so that the pattern can be in direct contact with the object to be measured. The Reticle Pattern is very durable, double layer, deposited evaporative Chrome/Chrome Oxide, for a reflectivity of less than 5% looking at the pattern. The Patterns on all Reticles manufactured by Max Levy are replicated from Precision Chrome on Glass Tooling under clean room conditions.
For a listing of Magnifiers that can be used with this reticle see the Magnifier/Comparator to Reticle matrix under ”Detailed Specifications”.