Max Levy Autograph (MLA) is an industry leader in special processing for unique and difficult applications. MLA has an experienced team of engineers and technicians who specialize in designing and creating high quality optical products that fit our customers’ high precision metrology needs. Some of the most common custom applications include MicroRules, Microscales, High Precision Grid and Dot Arrays, Reticles, Gray Scale Targets, Machine Vision Scales, and Clear Optical Path targets.
MLA's capabilities cover the UV-VIS-IR and X-Ray spectrums. A wide variety of metals and dielectrics can be patterned on an assortment of substrates in which submicron features and alignments are typical. Substrate dimensions can range from 1mm x 1mm to 3000mm x 2000mm.
Substrates
- All Glasses
- Sapphire
- Zinc Sulfide, Zinc Selenide
- Multispectrals
- Silicon Wafers
- Barium Fluoride, Calcium Fluoride
- Ceramics
- Fluorescent Glass Filters
- Optical Grade Polymers
- Mylar, Melinex, Kapton, and other Films
Common Coatings
- Gold
- Aluminum
- Silver
- Chromium
- Copper
- Nickel
- Platinum
- Titanium
- Dielectrics
- Protected Aluminum
- AR Coatings
- Low Reflection or High Contrast
Example Products
- Distortion/Dot targets
- Resolution targets
- USAF, Ronchi, or custom
- Replication down to 600 line pairs per mm
- Finer resolution with direct write
- Optical gauges
- Reticles
- Chrome on glass for inspection
- Etch-and-fill for side illuminated applications
- High-end rifle scope reticles
- Spectrophotometer slits
- Visible and IR applications
- High OD opaque areas with sharp slit edges (edge acuity ≤ ½ µm)
- Medical test slides
- Lens obscuration masks
- Laser alignment fiducials
- Scene targets
- Half tone process
- ≥128 gray levels usually possible
- Dewar windows (patterned Cr/Ni/Au stack)
- Encoder disks
- EMI shielded windows